06EC56 Fundamentals of CMOS VLSI syllabus for EC


Part A
Unit-1 Basic MOS technology MOS Transistor Theory 8 hours

Basic MOS technology: Integrated circuit’s era. Enhancement and depletion mode MOS transistors. nMOS fabrication. CMOS fabrication. Thermal aspects of processing. BiCMOS technology. Production of E-beam masks. 4 Hours MOS Transistor Theory: Introduction, MOS Device Design Equations, The Complementary CMOS Inverter – DC Characteristics, Static Load MOS Inverters, The Differential Inverter, The Transmission Gate, Tristate Inverter. 4 Hours

Unit-2 Circuit design processes 7 hours

Circuit design processes: MOS layers. Stick diagrams. Design rules and layout – lambda-based design and other rules. Examples. Layout diagrams. Symbolic diagrams. Tutorial exercises. 4 Hours Basic Physical Design of Simple logic gates. 3 Hours

Unit-3 CMOS logic structures 6 hours

CMOS Complementary Logic, Bi CMOS Logic, Pseudo-nMOS Logic, Dynamic CMOS Logic, Clocked CMOS Logic, Pass Transistor Logic, CMOS Domino Logic Cascaded Voltage Switch Logic (CVSL).

Unit-4 Basic circuit concepts Scaling of MOS circuits 7 hours

Basic circuit concepts: Sheet resistance. Area capacitances. Capacitance calculations. The delay unit. Inverter delays. Driving capacitive loads. Propagation delays. Wiring capacitances. 4 Hours Scaling of MOS circuits: Scaling models and factors. Limits on scaling. Limits due to current density and noise. 3 Hours

Part B
Unit-5 CMOS subsystem design 8 hours

CMOS subsystem design: Architectural issues. Switch logic. Gate logic. Design examples – combinational logic. Clocked circuits. Other system considerations. 4 Hours Clocking Strategies 4 Hours

Unit-6 CMOS subsystem design processes 6 hours

General considerations. Process illustration. ALU subsystem. Adders. Multipliers.

Unit-7 Memory, registers and clock 5 hours

Timing considerations. Memory elements. Memory cell arrays.

Unit-8 Testability 5 hours

Performance parameters. Layout issues. I/O pads. Real estate. System delays. Ground rules for design. Test and testability.

Last Updated: Tuesday, January 24, 2023