1. Black box experiment; Identification of unknown passiveelectrical components and determine the value of Inductanceand Capacitance
Series and parallel LCR Circuits (Determination of resonantfrequency and quality factor)
I–V Characteristics of Zener Diode. (determination of kneevoltage, zener voltage and forward resistance)
Characteristics of Transistor (Study of Input and Outputcharacteristics and calculation of input resistance, outputresistance and amplification factor)
Photo Diode Characteristics (Study of I–V characteristics inreverse bias and variation of photocurrent as a function ofreverse voltage and intensity).
Dielectric constant (Measurement of dielectric constant).
Diffraction (Measurement of wavelength of laser source usingdiffraction grating).
Torsional pendulum (Determination of M.I. of wire andRigidity modulus).
Determination of Fermi energy. (Measurement of Fermi energyin copper).
Uniform Bending Experiment (Determination of Youngsmodulus of material bar).
Newtons Rings, (Determination of radius of curvature ofplano convex lens).
Verification of Stefan’s Law